Computer Integrated Testing(1st Edition)

Authors:

Allen Buckroyd

Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New

In Stock: 2 Left

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Book details

ISBN: 0471504866, 978-0471504863

Book publisher: Wiley-Interscience

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Book Price $68.87 : A Practical Guide To Incorporating Computer-integrated Testing (CIT) Procedures Into A Computer-integrated Manufacturing (CIM) Line. Surveys The Latest Automated Test Equipment (ATE) And Discusses How To Integrate ATE Into CIM In Order To Maximize Benefits. Contains Case Studies In CIT, Focusing On Applications In The Electronics Industry.