Semiconductor Memories Technology Testing And Reliability(1st Edition)

Authors:

Ashok K Sharma

Type:Hardcover/ PaperBack / Loose Leaf
Condition: Used/New

In Stock: 2 Left

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Book details

ISBN: 0780310004, 978-0780310001

Book publisher: Wiley-IEEE Press

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Book Price $0 : Semiconductor Memories Provides In-depth Coverage In The Areas Of Design For Testing, Fault Tolerance, Failure Modes And Mechanisms, And Screening And Qualification Methods Including. * Memory Cell Structures And Fabrication Technologies. * Application-specific Memories And Architectures. * Memory Design, Fault Modeling And Test Algorithms, Limitations, And Trade-offs. * Space Environment, Radiation Hardening Process And Design Techniques, And Radiation Testing. * Memory Stacks And Multichip Modules For Gigabyte Storage.