The article "Calibration of an FTIR Spectrometer" (P. Pankratz, Statistical Case Studies for Industrial and Process Improvement, SIAM-ASA, 1997:19-38) describes the use of a spectrometer to make five measurements of the carbon content (in ppm) of a certain silicon wafer on each of two successive days. The results were as follows:

Can you conclude that the calibration of the spectrometer has changed from the first day to the second day?

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Day: 2.1321 2.1385 2.0985 2.0941 2.0680 Day 2 2.0853 2.1476 2.0733 2.1194 2.0717