The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample

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The fraction of defective integrated circuits produced in a photolithography process is being studied. A random sample of 300 circuits is tested, revealing 13 defectives. Find a 95% two-sided CI on the fraction of defective circuits produced by this particular tool.
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Applied Statistics And Probability For Engineers

ISBN: 9781118539712

6th Edition

Authors: Douglas C. Montgomery, George C. Runger

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