Suppose that, with the evolution of the electronic devices manufacturing technology, the yield varies as shown in

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Suppose that, with the evolution of the electronic devices manufacturing technology, the yield varies as shown in the following table.Yield T1 0.85 T2 0.89 T3 0.92 T4 0.95

Find the defects per area unit for each technology given a die area of 200 mm2.

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Computer Organization And Design The Hardware Software Interface

ISBN: 9780123747501

4th Revised Edition

Authors: David A. Patterson, John L. Hennessy

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