Question: The following table shows manufacturing data for various processors. If the number of dies per wafer is increased by 10% and the defects per area

The following table shows manufacturing data for various processors. a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031

If the number of dies per wafer is increased by 10% and the defects per area unit increases by 15%, find the die area and yield.

a. b. Wafer Diameter 15 cm 20 cm Dies per Wafer 84 100 Defects per Unit Area 0.020 defects/cm 0.031 defects/cm Cost per Wafer 12 15

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