An experiment has been run in a process that applies a coating material to a wafer. Each

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An experiment has been run in a process that applies a coating material to a wafer. Each run in the experiment produced a wafer, and the coating thickness was measured several times at different locations on the wafer. Then the mean y1 and standard deviation y2 of the thickness measurement was obtained. The data [adapted from Box and Draper (1987)] are shown in the table below: 

Mean Std. Dev. Run Speed Pressure Distance y2 1 -1.000 -1.000 -1.000 24.0 12.5 0.000 -1.000 -1.000 120.3 8.4 3 1.000 -1.000 -1.000 213.7 42.8 4 -1.000 0.000 -1.000 86.0 3.5 5 0.000 0.000 -1.000 136.6 80.4 1.000 0.000 -1.000 340.7 16.2 7 -1.000 1.000 -1.000 112.3 27.6 8 0.000


(a) What type of design did the experimenters use? Is this a good choice of design for fitting a quadratic model?

(b) Build models of both responses.

(c) Find a set of optimum conditions that result in the mean as large as possible with the standard deviation less than 60.

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