Question: 4 ) A process for producing electron circuits has achieved very high yield levels. An average of only 8 defective parts per million is currently
A process for producing electron circuits has achieved very high yield levels. An average of only defective parts per million is currently produced.
a what are the upper and lower control limits for a sample size of
b Recompute the upper and lower control limits for a sample size of
c Which of these two sample sizes would you recommend? Explain why.
The Robin Hood Bank has noticed a decline in daily deposits. The average daily deposit has been running at $ Million with an average range of $ Million over the past year. The deposits over the past days have been and
a What are the CL UCL, and LCL for the x and R charts based on a sample size of days?
b Compute an average and range for the sample that consists of the past days. Do the figures for the past six days suggest a change in the average or range from the past year?
A certain process has an upper specification limit of and a lower specification limit of The process standard deviation is and the mean is
a Calculate the Cp and the Cpk for this process.
b What could be done to improve the process capability Cpk to
A customer has specified that they require a process capability of Cp for a certain product. Assume that the USL assume that the LSL and the process is centered within the specification range.
a What standard deviation should the process have?
b What is the process mean value?
c What can the company do if it is not capable of meeting these requirements?
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