K Pull-strength tests on 10 soldered leads for a semiconductor device yield the results provided in the accompanying data set (Sample 1), in pounds of force required to rupture the bond. Another set of 8 leads was tested after encapsulation to determine whether the pull strength had been increased by encapsulation of the device, with the results also provided in the accompanying data set (Sample 2). Comment on the evidence available concerning equality of the two population Click here to view the data set. variances. Click here to view page 1 of the table of critical values of the f-distribution, for alpha = 0.01. Click here to view page 2 of the table of critical values of the f-distribution, for alpha = 0.01. Click here to view page 1 of the table of critical values of the f-distribution, for alpha = 0.05. Click here to view page 2 of the table of critical values of the f-distribution, for alpha = 0.05. The computed f-value with v = 9 and v2 = 7 degrees of freedom is f = (Round to two decimal places as needed.) Since P(F>f) is the variances be equal.