Question: Place: Quality measured by the defect rate obtained, using P chart with sample average = 1 0 0 , assume process centered and two -

Place: Quality measured by the defect rate obtained, using P chart with sample average
=
1
0
0
,
assume process centered and two
-
sided specification limit
Reject rate
_
_
1
in
2
,
0
0
0
,
_
_
_
_
%
,
_
_
_
_
_
PPM
,
Yield
_
_
_
_
_
_
_
_
_
_
_
_
_
%
,
Cp
_
_
_
_
_
_
_
_
,
Cpk
_
_
_
_
_
_
_
_
_
_
_

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