Question: Place: Quality measured by the defect rate obtained, using nP chart, assume process centered and two-sided specification limit Reject rate 4 in 10,000, % PPM,

Place: Quality measured by the defect rate

Place: Quality measured by the defect rate obtained, using nP chart, assume process centered and two-sided specification limit Reject rate 4 in 10,000, % PPM, Yield %

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