Q$.4($i$)$ In a test generation process for a combinational circuit six tests, $t1,t2,t3,t4,t5,t6$ are generated to cover a set of given faults. Later it is discovered that we are interested only in a subset of the faults and the subset consists of eight faults, $f1,f2,f3,f4,f5,f6,f7,$ f$8.$ Though simulating the six tests for each of the faults $($without fault dropping$)$ we find the detection capability of each test as given below.

The test $t1$ can detect faults $f3$ and $f5.$

The test $t2$ can detect faults $f2$ and $f7.$

The test $t3$ can detect faults $f2,f3,$ and $f7.$