Question: Q . 4 ( i ) In a test generation process for a combinational circuit six tests, t 1 , t 2 , t 3
Qi In a test generation process for a combinational circuit six
tests, are generated to cover a set of given faults.
Later it is discovered that we are interested only in a subset of the
faults and the subset consists of eight faults,
fThough simulating the six tests for each of the faults without fault
dropping we find the detection capability of each test as given below.
The test can detect faults and
The test can detect faults and
The test can detect faults and
The test can detect faults and
The test can detect faults and
The test can detect faults and
Find a smallest set of tests that can detect all eight faults. You must
show your work to prove that the set obtained by you is the smallest
set.
iiConsider a characteristic polynomial Now answer the
following and you must show your work for full credit.
iiaIs this polynomial primitive?
iibGive an internal exclusiveOR modular realization of this
polynomial.
iicDesign a four stage cellular automata whose cells follow Rule
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