Question: Q . 4 ( i ) In a test generation process for a combinational circuit six tests, t 1 , t 2 , t 3

Q.4(i) In a test generation process for a combinational circuit six
tests, t1,t2,t3,t4,t5,t6 are generated to cover a set of given faults.
Later it is discovered that we are interested only in a subset of the
faults and the subset consists of eight faults, f1,f2,f3,f4,f5,f6,f7,
f8.Though simulating the six tests for each of the faults (without fault
dropping) we find the detection capability of each test as given below.
The test t1 can detect faults f3 and f5.
The test t2 can detect faults f2 and f7.
The test t3 can detect faults f2,f3, and f7.
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The test t4 can detect faults f1,f2, and f7.
The test t5 can detect faults f4, and f6.
The test t6 can detect faults f,f4,f6 and f8.
Find a smallest set of tests that can detect all eight faults. You must
show your work to prove that the set obtained by you is the smallest
set.
(ii)Consider a characteristic polynomial x5+x+1. Now answer the
following and you must show your work for full credit.
(ii.a)Is this polynomial primitive?
(ii.b)Give an internal exclusive-OR (modular) realization of this
polynomial.
(ii.c)Design a four stage cellular automata whose cells follow Rule 90.
 Q.4(i) In a test generation process for a combinational circuit six

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