Question: question 5 5-The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample

question 5

5-The number of contaminating particles on a silicon wafer prior to a certain rinsing process was determined for each wafer in a sample size 100, resulting in the following frequencies: Cumulative Cumulative Number of Particles Freguencx Number of Particles Frauencg 0 1 8 84 1 3 9 88 2 6 10 93 3 18 1 1 96 4 29 12 97 5 44 13 99 6 62 14 100 7 72 a) What proportion of the sampled wafers had ( P 2 6 ) ? (10 pts) b) What proportion of the sampled wafers had between (7

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