Question: Someone has designed the following test, called the write-address test (WAT), for a memory consisting of 1024 8-bit words: For I = 0 to 1023

Someone has designed the following test, called the write-address test (WAT), for a memory consisting of 1024 8-bit words:

For I = 0 to 1023 do A[I] := (I mod 256);

This means that address 0, A[0], gets the value 0 (i.e., A[0]:=0), A[1]:=1,

. . . , A[255]:=255, A[256]:=0, A[257]:=1, etc.

For I = 0 to 1023 do { Read A[I]; A[I]:= 255(I mod 256) }; i.e., Read A[I] and Write the complement of (I mod 256).

For I = 0 to 1023 do Read A[I] Verify whether this test detects all unlinked AFs, SAFs, TFs, and CFsts. Hint: In order to get a quick feel for the fault coverage, assume initially that the memory consists of 1-bit words (i.e., B = 1).

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