Proceedings Of The NIELITs International...
By: Sri Niwas Singh, Saurov Mahanta, Yumnam Jayanta Singh
Date: Nov 09, 2023 Edition: 1st EditionISBN: 9819916984, 978-9819916986
Testability Concepts For Digital ICs The Macro...
By: F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792396588, 978-0792396581
Defect Oriented Testing For CMOS Analog And...
By: Manoj Sachdev
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792380835, 978-0792380832
Multi Chip Module Test Strategies
By: Yervant Zorian
Date: Nov 10, 2023 Edition: 1st EditionISBN: 079239920X, 978-0792399209
SOC System On A Chip Testing For Plug And Play...
By: Krishnendu Chakrabarty
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402072058, 978-1402072055
Fault Injection Techniques And Tools For Embedded...
By: Alfredo Benso, Paolo Prinetto
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402075898, 978-1402075896
Analog And Mixed Signal Boundary Scan A Guide To...
By: Adam Osseiran
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792386868, 978-0792386865
Introduction To Advanced System On Chip Test...
By: Erik Larsson
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402032072, 978-1402032073
Embedded Processor Based Self Test
By: Dimitris Gizopoulos, A. Paschalis, Yervant Zorian
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402027850, 978-1402027857
A Designers Guide To Built In Self Test
By: Charles E. Stroud
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402070500, 978-1402070501
On Line Testing For VLSI
By: Michael Nicolaidis
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792381327, 978-0792381327
Boundary Scan Interconnect Diagnosis
By: José T. De Sousa, Peter Y.K. Cheung
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792373146, 978-0792373148
Delay Fault Testing For VLSI Circuits
By: Angela Krstic Kwang-Ting Cheng
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792382951, 978-0792382959
Power Constrained Testing Of VLSI Circuits
By: Nicola Nicolici, Bashir M. Al-Hashimi
Date: Nov 10, 2023 Edition: 1st EditionISBN: 140207235X, 978-1402072352
Formal Equivalence Checking And Design Debugging
By: Shi-Yu Huang, Kwang-Ting Cheng
Date: Nov 10, 2023 Edition: 1st EditionISBN: 079238184X, 978-0792381846
High Performance Memory Testing Design Principles...
By: R. Dean Adams
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402072554, 978-1402072550
Digital Timing Measurements From Scopes And...
By: Wolfgang Maichen
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1841270253, 978-0387314181
Research Perspectives And Case Studies In System...
By: John W. Sheppard, William R. Simpson
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792382633, 978-0792382638
The Core Test Wrapper Handbook Rationale And...
By: Francisco Da Silva, Teresa McLaurin, Tom Waayers
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0387307516, 978-0387307510
From Contamination To Defects Faults And Yield...
By: Jitendra B. Khare, Wojciech Maly
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0792397142, 978-0792397144
Data Mining And Diagnosing IC Fails
By: Leendert M. Huisman
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0387249931, 978-0387249933
Elements Of STIL Principles And Applications Of...
By: Gregory A. Maston, Tony R. Taylor, Julie N. Villar
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1461350891, 978-1461350897
Fault Tolerance Techniques For SRAM Based FPGAs
By: Fernanda Lima Kastensmidt, Ricardo Reis
Date: Nov 10, 2023 Edition: 1st EditionISBN: 0387310681, 978-0387310688
Introduction To IDDQ Testing
By: S. Chakravarty, Paul J. Thadikaran
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1461378125, 978-1461378129
Oscillation Based Test In Mixed Signal Circuits
By: Gloria Huertas Sánchez, Diego Vázquez García De La Vega
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402053142, 978-1402053146
Soft Errors In Modern Electronic Systems
By: Michael Nicolaidis
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1441969926, 978-1441969927
Defect Oriented Testing For Nano Metric CMOS VLSI...
By: Manoj Sachdev, José Pineda De Gyvez
Date: Nov 10, 2023 Edition: 2nd EditionISBN: 0387465464, 978-0387465463
Models In Hardware Testing Lecture Notes Of The...
By: Hans-Joachim Wunderlich
Date: Nov 10, 2023 Edition: 1st EditionISBN: 9048132819, 978-9048132812
Emerging Nanotechnologies Test Defect Tolerance...
By: Mohammad Tehranipoor
Date: Nov 10, 2023 Edition: 1st EditionISBN: 038774746X, 978-0387747460
CMOS SRAM Circuit Design And Parametric Test In...
By: Pavlov
Date: Nov 10, 2023 Edition: 1st EditionISBN: 1402083629, 978-1402083624
