(a) A frequently used empirical approximation for the yield of an IC process as a function of...
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Fig. 2.68.
(b) Use the expression derived in (a), together with the gross-die-per-wafer curves shown in Fig. 2.69, to develop an analytical expression for the cost of silicon per unit area as a function of die size, Ydf , Yft , Cp, and Cw for each of the three processes A,B, and C.
Fig. 2.69.
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Related Book For
Analysis and Design of Analog Integrated Circuits
ISBN: 978-0470245996
5th edition
Authors: Paul R. Gray, Paul J. Hurst Stephen H. Lewis, Robert G. Meyer
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