Let us assume that processor testing is done by illing the PC, registers, and data and instruction memories with some values (you can choose which values), letting a single instruction execute, then reading the PC, memories, and registers. These values are then examined to determine if a particular fault is present. Can you design a test (values for PC, memories, and registers) that would determine if there is a stuck-at-0 fault on this signal?

When silicon chips are fabricated, defects in materials (e.g., silicon) and manufacturing errors can result in defective circuits. A very common defect is for one wire to affect the signal in another. This is called a cross-talk fault. A special class of cross-talk faults is when a signal is connected to a wire that has a constant logical value (e.g., a power supply wire). In this case we have a stuck-at-0 or a stuck-at-1 fault, and the affected signal always has a logical value of 0 or 1, respectively.

The following problems refer to the following signal from Figure 4.24:

Figure 4.24

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a. Registers, input Write Register, bit 0 b. Signal Add unit in upper right corner, ALU result, bit 0