Two factors in a manufacturing process for an integrated circuit were studied in a two-factor experiment. The

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Two factors in a manufacturing process for an integrated circuit were studied in a two-factor experiment. The purpose of the experiment is to learn their effect on the resistivity of the wafer. The factors are implant dose (2 levels) and furnace position (3 levels). Experimentation is costly so only one experimental run is made at each combination. The data are as follows. It is to be assumed that no interaction exists between these two factors.(a) Write the model and explain terms.(b) Show the analysis of variance table.(c) Explain the 2 "error" degrees of freedom.(d) Use Tukey's test to do multiple-comparison tests on furnace position. Explain what the resultsshow.

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Probability & Statistics For Engineers & Scientists

ISBN: 9780130415295

7th Edition

Authors: Ronald E. Walpole, Raymond H. Myers, Sharon L. Myers, Keying

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Question Posted: Feb 04, 2011 04:38 AM

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a Yijk l a ij jk i 1 2 a j 12b k12 78 b The ANOVA table is Sourc...View the full answer

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